IDT70T633/1S
High-Speed 2.5V 512/256K x 18 Asynchronous Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Sleep Mode
The IDT70T633/1 is equipped with an optional sleep or low power
mode on both ports. The sleep mode pin on both ports is active high. During
normal operation, the ZZ pin is pulled low. When ZZ is pulled high, the
port will enter sleep mode where it will have the lowest possible power
consumption. The sleep mode timing diagram demonstrates the modes of
operation: Normal Operation, No Read/Write Allowed and Sleep Mode.
For a period of time prior to sleep mode and after recovering from sleep
mode (t ZZS and t ZZR ), new reads or writes are not allowed. If a write or read
operation occurs during these periods, the memory array may be
corrupted. Validity of data out from the RAM cannot be guaranteed
immediately after ZZ is asserted (prior to being in sleep).
During sleep mode the RAM automatically deselects itself and discon-
nects its internal buffer. All outputs will remain in high-Z state while in sleep
mode. All inputs are allowed to toggle, but the RAM will not be selected and
will not perform any reads or writes.
JTAG Timing Specifications
t JCYC
t JF
t JCL
t JR
t JCH
TCK
Device Inputs (1) /
TDI/TMS
Device Outputs (2) /
t JS
t JH
t JDC
TDO
TRST
t JRSR
t JCD
x
5670 drw 23
t JRST
NOTES:
1. Device inputs = All device inputs except TDI, TMS, and TRST.
2. Device outputs = All device outputs except TDO.
JTAG AC Electrical
Characteristics (1,2,3,4,5)
70T633/1
3
3
Symbol
t JCYC
t JCH
t JCL
t JR
t JF
t JRST
Parameter
JTAG Clock Input Period
JTAG Clock HIGH
JTAG Clock Low
JTAG Clock Rise Time
JTAG Clock Fall Time
JTAG Reset
Min.
100
40
40
____
____
50
Max.
____
____
____
(1)
(1)
____
Units
ns
ns
ns
ns
ns
ns
t JRSR
t JCD
t JDC
t JS
t JH
JTAG Reset Recovery
JTAG Data Output
JTAG Data Output Hold
JTAG Setup
JTAG Hold
50
____
0
15
15
____
25
____
____
____
ns
ns
ns
ns
ns
NOTES:
1. Guaranteed by design.
2. 30pF loading on external output signals.
3. Refer to AC Electrical Test Conditions stated earlier in this document.
4. JTAG operations occur at one speed (10MHz). The base device may run at
any speed specified in this datasheet.
5. JTAG cannot be tested in sleep mode.
5670 tbl 20
24
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